The Innova® Atomic Force Microscope (AFM) delivers accurate, high-resolution imaging and a wide range of functionality for advanced research in physical, life, and material sciences. The system has been engineered to provide an unmatched combination of productivity, ease of use, and application flexibility for the most demanding scientific research, all at a moderate cost.
High-Resolution System
- Utilizes an innovative design optimized for lowest closed-loop noise and drift
- Ensures accurate measurements at all scales and in all dimensions
- Delivers highest resolution results with great ease
Fast Setup for Every Experiment
- Provide fastest hardware setup via ergonomic open stage and premounted cantilever option
- Ensures fast and precise region of interest identification with software-controlled high-NA optics
- Distills decades of AFM expertise into preconfigured software settings
- Enables seamless operation from survey to atomic resolution
Powerful Research Flexibility
- Addresses all advanced measurements with full range of SPM modes
- Customizes research with configurable signal access and physical access to tip-sample junction
- Offers nano-optics with TERS-enabled AFM-Raman integration